A surface stacking fault energy approach to predicting defect nucleation in surface-dominated nanostructures

نویسندگان

  • Jin-Wu Jiang
  • Austin M. Leach
  • Ken Gall
  • Harold S. Park
  • Timon Rabczuk
چکیده

We present a surface stacking fault (SSF) energy approach to predicting defect nucleation from the surfaces of surface-dominated nanostructure such as FCC metal nanowires. The approach leads to a criterion that predicts the initial yield mechanism via either slip or twinning depending on whether the unstable twinning energy or unstable slip energy is smaller as determined from the resulting SSF energy curve. The approach is validated through a comparison between the SSF energy calculation and low-temperature classical molecular dynamics simulations of copper nanowires with different axial and transverse surface orientations, and cross sectional geometries. We focus on the effects of the geometric cross section by studying the transition from slip to twinning previously predicted in moving from a square to rectangular cross section for 〈100〉=f100g nanowires, and also for moving from a rhombic to truncated rhombic cross sectional geometry for 〈110〉 nanowires. We also provide the important demonstration that the criterion is able to predict the correct deformation mechanism when full dislocation slip is considered concurrently with partial dislocation slip and twinning. This is done in the context of rhombic 〈110〉 aluminum nanowires which do not show a tensile reorientation due to full dislocation slip. We show that the SSF energy criterion successfully predicts the initial mode of surface-nucleated plasticity at low temperature, while also discussing the effects of strain and temperature on the applicability of the criterion. & 2013 Elsevier Ltd. All rights reserved.

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

ثبت نام

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

منابع مشابه

Kinetic model for mechanical twinning and its application for intensive loading of metals

In this report, we present our twinning model intended for simulation of the dynamic deformation of metals with low values of the stacking fault energy, as well as the results of application of the model to numerical simulation of intensive loading of metals. Generation of a twin is described as an appearance of a stacking fault with size more than some critical value, while growth of a twin is...

متن کامل

Observation of Stacking Fault Tetrahedral in TWIP Steel

Low stacking fault energy face centered cubic (FCC) materials contain characteristic defect structures. Stacking fault tetrahedral are one of those rare structures that occur under special experimental conditions. For the first time, stacking fault tetrahedral were observed in Fe-30Mn-3Al-3Si twinning induced plasticity (TWIP) steel. Their presence resulted from a quenching heat treatment.

متن کامل

Stacking Fault Energy and Microstructural Insight into the Dynamic Deformation of High-Manganese TRIP and TWIP Steels

The dynamic behavior of three high manganese steels with very different stacking faultenergy (SFE) values (4-30 mJ/m2) were studied using high strain rate torsional tests. The hotrolledmicrostructure of the steel with the lowest SFE of 4 mJ/m2 consisted of a duplex mixture ofaustenite and ε-martensite, but those of the other two steels were fully austenitic. The deformedmicrostructures were stu...

متن کامل

Stacking fault emission from grain boundaries: Material dependencies and grain size effects

When load is applied to fcc nanograins, leading partial dislocations nucleate at grain boundary steps and propagate into the grain, leaving stacking faults behind. The extent to which these faults expand before a trailing partial is emitted generally does not equal the equilibrium separation distance of the corresponding full dislocation. Here we use a density functional theory – phase field di...

متن کامل

Relationship between monolayer stacking faults and twins in nanocrystals

A density functional theory–phase field dislocation dynamics model is used to study stress-induced emission of defects from grain boundaries in nanoscale face-centered cubic (fcc) crystals under ambient conditions. The propensity for stable stacking fault formation and the maximum grain size DSF below which a stacking fault is stable are found to scale inversely with the normalized intrinsic st...

متن کامل

ذخیره در منابع من


  با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

ثبت نام

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

عنوان ژورنال:

دوره   شماره 

صفحات  -

تاریخ انتشار 2013